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Journals

Interface Sharpness in Low-Order III-V Superlattices

December 31, 1992

Author(s)

Joseph G. Pellegrino, S. B. Qadri, Paul M. Amirtharaj, Nhan Van Nguyen, J. Comas

Imaging of Passivated III-V Semiconductor Surfaces by a Scanning Tunneling Microscope Operating in Air

December 31, 1992

Author(s)

John A. Dagata, W. F. Tseng, J. Bennett, J. Schneir, Howard H. Harary

The Measurement, Use, and Interpretation of the Temperature Coefficient of Resistance of Metallizations

December 31, 1992

Author(s)

Harry A. Schafft, John S. Suehle

An Experimental Comparison of Measurement Techniques to Extract Si-SiO₂ Interface Trap Density

December 31, 1992

Author(s)

S C. Witczak, John S. Suehle, Michael Gaitan

Effects of Heavy Doping on Numerical Simulations of Gallium Arsenide Bipolar Transistors

December 31, 1992

Author(s)

M. Tomizawa, T. Ishibashi, Herbert S. Bennett, J R. Lowney

Retention Behavior of Alkylated Phenanthrenes on a Smectic Liquid Crystalline Phase: Application to Organic Geochemistry

December 25, 1992

Author(s)

H. Budzinski, M. Radke, P. Garrigues, Stephen Wise, J. Bellocq, H. Willsch

Characterization of Vertical-Cavity Semiconductor Structures

December 15, 1992

Author(s)

David H. Christensen, S. M. Crochiere, C. A. Parsons, Joseph G. Pellegrino, Robert K. Hickernell, R. S. Rai

Multi-Wavelength Birefringent-Cavity Mode-Locked Fibre Laser

December 3, 1992

Author(s)

H. Takara, S. Kawanishi, M. Saruwatari, John B. Schlager

Trapping Atoms with Optical Potentials

December 1, 1992

Author(s)

S L. Rolston, C Gerz, Kristian Helmerson, Poul Jessen, Paul D. Lett, William D. Phillips, R J. Spreeuw, C I. Westbrook

Visibility of Exit Signs in Clear and Smoky Conditions

December 1, 1992

Author(s)

Belinda L. Collins, M S. Dahir, Daniel M. Madrzykowski

In the present study, the visibility of several types of internally lit exit signs was assessed under both clear and smoky conditions. In the evaluation both...

Toxic Potency Measurement for Fire Hazard Analysis. Technical Note.

December 1, 1992

Author(s)

V Babrauskas, B C. Levin, Richard G. Gann, M Paabo, Richard H. Harris Jr., Richard D. Peacock, S Yusa

A comprehensive methodology has been developed for obtaining and using smoke toxicity data for fire hazard analysis. This description of the methodology...

A Custom Integrated Circuit Comparator for High Performance Sampling Applications

December 1, 1992

Author(s)

Owen B. Laug, T. M. Souders, D. R. Flach

High-Accuracy Sampling Wattmeter

December 1, 1992

Author(s)

Gerard N. Stenbakken, A. Dolev

Design and Implementation of a Collaborative Study of the Mutagenicity of Complex Mixtures in Salmonella Typhimurium

December 1, 1992

Author(s)

J Lewtas, L.D. Claxton, H.S. Rosenkranz, D. Schuetzle, M. Shelby, H. Matsushita, F.E. Wurgler, G. Lofroth, Willie E. May, D. Krewski, T. Matsushima, Y. Ohnishi, H.N. Gopalan, R. Sarin, G.C. Becking

International Intercomparison of Detector Responsivity at 1300 and 1550 nm

December 1, 1992

Author(s)

J. L. Gardner, R. L. Gallawa, K. D. Stock, D. H. Nettleton

Evidence for Structural Change and a Deep Electron Trap in Separation by Implanted Oxygen Oxides

December 1, 1992

Author(s)

J. F. Conley, Patrick M. Lenahan, Peter Roitman

Localized Plasma Etching for Device Optimization

December 1, 1992

Author(s)

Donald R. Larson, D. L. Veasey

Electron and Hole Trapping in Irradiated SIMOX, ZMR, and BESOI Buried Oxides

December 1, 1992

Author(s)

R. E. Stahlbush, G. J. Campisi, J. B. McKitterick, W. P. Maszara, Peter Roitman, George A. Brown

Voltage Gain in the Single-Electron Transistor

November 23, 1992

Author(s)

G. Zimmerli, Richard L. Kautz, John M. Martinis

A Dynamic Electro-Thermal Model for the IGBT

November 16, 1992

Author(s)

Allen R. Hefner Jr.

Flow of microemulsions through microscopic pores

November 15, 1992

Author(s)

Dean C. Ripple, Robert F. Berg

The flow of the microemulsion dioctylsulfosuccinate (AOT)/decane/water through 0.1 and 1.0 um diameter pores was studied for water droplet volume fractions...

Nd:LiTaO₃ Waveguide Laser

November 15, 1992

Author(s)

Norman Sanford, J. A. Aust, K. J. Malone, Donald R. Larson, Alexana Roshko

Yba₂Cu₃O_7-x to Si Interconnection for Hybrid Superconductor/Semiconductor Integration

November 2, 1992

Author(s)

Todd E. Harvey, John M. Moreland, Blaise Jeanneret, Ronald H. Ono, David A. Rudman

Currents Induced on Multiconductor Transmission Lines by Radiation and Injection

November 1, 1992

Author(s)

David A. Hill

Electromagnetic Scattering by a Periodic Surface with a Wedge Profile

November 1, 1992

Author(s)

David A. Hill

Determination of Complex Scattering Amplitudes in Low-Energy Elastic Electron-Sodium Scattering

November 1, 1992

Author(s)

Jabez McClelland, Steven R. Lorentz, R E. Scholten, Michael H. Kelley, Robert Celotta

Measurements of spin-resolved elastic electron-sodium scattering have been carried out at incident energies of 4.1 and 12.1 eV, and the ratio of triplet to...

STEP -- Standard for the Exchange of Product Model Data

November 1, 1992

Author(s)

Howard Bloom

This note provides a brief description on the definition of the STandard for the Exchange of Product model data (STEP) and how it will be used by the Department...

Accuracy of the Electron Pump

November 1, 1992

Author(s)

H. D. Jensen, John M. Martinis

High-Level CAD Melds Micromachined Devices with Foundries

November 1, 1992

Author(s)

Janet M. Cassard, M. Parameswaran, Mona E. Zaghloul, Michael Gaitan

Techniques and Characterization of Pulsed Electromigration at the Wafer Level

November 1, 1992

Author(s)

John S. Suehle, Harry A. Schafft

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