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Conferences

Numerical Analysis of Doubly Rotated Cut SAW Devices

April 30, 1980

Author(s)

Dylan Williams, F Y. Cho

Results of a numerical study of the properties of surface acoustic waves (SAW) on doubly rotated cuts of alpha quartz are presented. First and second order TCF...

A Measurement and Control Model for Adaptive Robots

March 7, 1980

Author(s)

James S. Albus, Tony Barbera, M L. Fitzgerald, R Nagel, G Vanderbrug, Thomas E. Wheatley

Laser Fluorescence Diagnostics of Lithium Vapor for InertialConfinement Applications

February 1, 1980

Author(s)

J. C. Wyss, W C. Stwalley, M E. Koch, K K. Verma

Electric Dyadic Green's Functions in the Source Region

February 1, 1980

Author(s)

A. D. Yaghjian

A System for Characterizing Detectors for the Measurement of Power of CO₂ TEA Laser Pulses

January 1, 1980

Author(s)

Philip A. Simpson

Magnetic State at the Surface of a Ferromagnet by Polarized Electron Diffraction

January 1, 1980

Author(s)

Robert Celotta, G P. Felcher, S Bader, Daniel T. Pierce, G Wang

Training of Epoxy-Impregnated Superconductor Windings

January 1, 1980

Author(s)

John (Jack) W. Ekin, R E. Schramm, M J. Superczynski

The Role of Backscatter Signatures in Optical Fiber Characterization

January 1, 1980

Author(s)

B. L. Danielson

Predicting Free-Space Radiated Emissions from ElectronicEquipment Using TEM Cell and Open-Field Site Measurements

January 1, 1980

Author(s)

M. L. Crawford, J L. Workman

Results of Planar Near-Field Measurements on a Compact Range at18 and 54 GHz

January 1, 1980

Author(s)

Andrew G. Repjar, D P. Kremer

Experiments In Part Acquisition Using Robot Vision

November 1, 1979

Author(s)

R Nagel, G Vanderbrug, James S. Albus, E Lowenfeld

Some Recent Near-Field Antenna Measurements

September 1, 1979

Author(s)

Carl F. Stubenrauch

Impulse Spectral Intensity -- What is it?

July 1, 1979

Author(s)

M G. Arthur

Fiber Measurements: Quality and Cost

June 1, 1979

Author(s)

Gordon W. Day

Conference on optical scattering standards

April 1, 1979

Author(s)

M. Young

This paper is a report on a conference, Standards for Scattering from Optical Surfaces, that was held February 6 and 7, 1979, at the National Bureau of...

Hierarchical Control of Robots using Microcomputers

March 15, 1979

Author(s)

Tony Barbera, James S. Albus, M L. Fitzgerald

A Vision System for Real-Time Control of Robots

March 13, 1979

Author(s)

G Vanderbrug, James S. Albus, Edward J. Barkmeyer Jr.

Coagulation of Smoke Aerosol in a Buoyant Plume.

February 5, 1979

Author(s)

Howard R. Baum, George W. Mulholland

The mechanism of particulate coagulation in a turbulent plume is studied by combining the Morton-Taylor-Turner theory of turbulent byouant plums with the...

Through-Load-Delay: An Improved Technique for Calibrating theDual Six-Port Automatic Network Analyzer

January 1, 1979

Author(s)

G F. Engen, C. A. Hoer

Measurement of Low Level Laser Pulses at l.064 υm

January 1, 1979

Author(s)

A. L. Rasmussen, A. A. Sanders

Experimental Evaluation of Engine-Driven Heat Pump Systems

December 11, 1978

Author(s)

B. R. Maxwell, David Didion

A laboratory investigation was conducted of an engine-driven air-to-air, variable speed, 3-ton Rankine heat pump. A water-cooled Stirling engine was used tin...

Annual Conference on Fire Research

December 1, 1978

Author(s)

C Huggett

This report contains extended abstracts of grants and contracts for fire research sponsored by the Center for Fire Research, National Bureau of Standards and...

RF Instrumentation Based on Superconducting Quantum Interference

April 1, 1978

Author(s)

Donald Sullivan, R T. Adair, Nolan V. Frederick

Applications of Closed-Cycle Cryocoolers to Small Superconducting Devices;

April 1, 1978

Author(s)

J. E. Zimmerman, T. M. Flynn

The Physica B&Cl Basis for Quantitative Surface Analysis by Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

January 1, 1978

Author(s)

Cedric J. Powell

A review is given of the physical basis for quantitative surface analysis by Auger electron spectroscopy (AES) and by X-ray photoelectron spectroscopy (XPS) or...