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Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells

Published

Author(s)

M. L. Crawford
Proceedings Title
Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells
Conference Dates
March 1, 1983
Conference Location
Detroit, MI, USA

Citation

Crawford, M. (1983), Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells, Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells, Detroit, MI, USA (Accessed July 14, 2024)

Issues

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Created February 28, 1983, Updated October 12, 2021