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Conferences

A New Method to Measure the Distance Between Graduation Lines on Graduated Scales

January 1, 1994

Author(s)

William B. Penzes, Robert Allen, Michael W. Cresswell, L Linholm, E C. Teague

Line scales are used throughout industry for a variety of applications. The most common is the stage micrometer, a small graduated glass scale for the...

A Method for the Spatial Calibration of a Commercial Phase Measuring Interferometer - Theoretical Aspects

January 1, 1994

Author(s)

P Sullivan, Christopher J. Evans

In a phase measuring interferometer (PMI), the interference pattern is focused on a charge coupled device (CCD) detector array and data points are sampled at...

The Development of a Calibrated Atomic Force Microscope

January 1, 1994

Author(s)

T Mcwaid, J Schneir

Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in...

The Geometric Characterization of Rockwell Diamond Indenters

January 1, 1994

Author(s)

Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith

By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell...

A Calibrated Atomic Force Microscope

January 1, 1994

Author(s)

T Mcwaid, J Schneir

Atomic force microscope (AFM) is a rapidly emerging measurement technology. As the technology develops, it is being incorporated into industrial research and...

An Improved Annealing Technique for Optical Fiber

January 1, 1994

Author(s)

Allen Rose, Z F. Ren, Gordon W. Day

Faraday Effect Current Sensor with Improved Sensitivity-Bandwidth Product

January 1, 1994

Author(s)

Kent B. Rochford, Allen Rose, M. N. Deeter, Gordon W. Day

Photodetector Frequency Response Measurements at NIST US and NPL UK: Preliminary Results of a Standards Laboratory Comparison

January 1, 1994

Author(s)

Paul D. Hale, David Humphreys, A. D. Gifford

Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials

January 1, 1994

Author(s)

S. W. Novak, J. M. Zavada, K. J. Malone

Integrated-Optical Devices in Rare-Earth-Doped Glass

January 1, 1994

Author(s)

K. J. Malone

Mode Coupling and Loss on Tapered Optical Waveguides

January 1, 1994

Author(s)

R. L. Gallawa, A. R. Kumar, A. Weisshar

Correlation of Optical, X-Ray, and Electron Microscopy Measurements on Semiconductor Multilayer Structures

January 1, 1994

Author(s)

David H. Christensen, Robert K. Hickernell, D. T. Schaafsma, Joseph G. Pellegrino, M. J. McCollum, J. R. Hill, R. S. Rai

Optical Sampling Using Nondegenerate Four-Wave Mixing in a Semiconductor Laser Amplifier

January 1, 1994

Author(s)

M. Jinno, John B. Schlager, Douglas L. Franzen

Measurement and Simulation of Photoluminescence Spectra from Vertical-Cavity Quantum-Well Laser Structures

January 1, 1994

Author(s)

D. T. Schaafsma, Robert K. Hickernell, David H. Christensen

A Polarization Insensitive 3x3 Sagnac Current Sensor Using Polarizing Spun High-Birefringence Fiber

January 1, 1994

Author(s)

I. G. Clarke, Kent B. Rochford, Allen Rose, Gordon W. Day

Efficient Vector Solution for Optical Waveguides Using Galerkin's Method with Hermite-Gauss Basic Functions

January 1, 1994

Author(s)

Andreas Weisshaar, J Li, R. L. Gallawa

Standard Polarization Components: Progress Toward an Optical Retardance Standard

January 1, 1994

Author(s)

Kent B. Rochford, Paul A. Williams, Allen Rose, I. G. Clarke, Paul D. Hale, Gordon W. Day

Effect of Semiconductor Laser Characteristics on Optical Fiber Sensor Performance

January 1, 1994

Author(s)

Kent B. Rochford, Allen Rose, I. G. Clarke, Gordon W. Day

Glasses for Waveguide Lasers

January 1, 1994

Author(s)

K. J. Malone, D. L. Veasey, Norman Sanford, J. A. Hayden

Modeling Buffer Layer IGBT's for Circuit Simulation

December 31, 1993

Author(s)

Allen R. Hefner Jr.

Status and Trends in Power Semiconductor Devices

December 31, 1993

Author(s)

David L. Blackburn

Normal-Incidence Complex-Index Refractometry

December 31, 1993

Author(s)

Robert D. Larrabee

Multijunction Thermal Converters by Commercial CMOS Fabrication

December 31, 1993

Author(s)

Michael Gaitan, John S. Suehle, Joseph R. Kinard Jr., D. X. Huang

Performance of Commercial CMOS Foundry-Compatible Multijunction Thermal Converters

December 31, 1993

Author(s)

Michael Gaitan, Joseph R. Kinard Jr., D. X. Huang

Thermal Component Models for Electrothermal Network Simulation

December 31, 1993

Author(s)

Allen R. Hefner Jr., David L. Blackburn

Electro-Thermal Simulation of an IGBT PWM Inverter

December 31, 1993

Author(s)

Alan Mantooth, Allen R. Hefner Jr.

Optical Performance of Photoinductive Mixers at Terahertz Frequencies

December 31, 1993

Author(s)

Erich N. Grossman, J. E. Sauvageau, Donald G. McDonald

An Electrical Test Structure for Improved Measurement of Feature Placement and Overlay in Integrated Circuit Fabrication Processes

December 31, 1993

Author(s)

Richard A. Allen, C. E. Schuster

Characterization of the ZnSe/GaAs Interface by TEM and Spectroscopic Ellipsometry

December 31, 1993

Author(s)

R. Dahmani, Lourdes Salamanca-Riba, Nhan Van Nguyen, Deane Chandler-Horowitz, B T. Jonker

Metrology Standards For Advanced Semiconductor Lithography Referenced to Atomic Spacings and Geometry

December 31, 1993

Author(s)

E C. Teague, Loren W. Linholm, Michael W. Cresswell, William B. Penzes, John A. Kramar, Fredric Scire, John S. Villarrubia, Jay S. Jun

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