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Conferences

Quantifying Usability: The Industry Usability Reporting Project

Author(s)
Jean C. Scholtz, Emile L. Morse, Sharon J. Laskowski, A Wishansky, K Butler
The paper describes the Common Industry format (CIF) developed in the Industry Usability Reporting Project (IUSR), which is now an ANSI standard. Four pilot

Use of Thermodynamic Software in Process Modelling and New Applications of Thermodynamic

Author(s)
Ursula R. Kattner, G Eriksson, I Hahn, R Schmid-fetzer, Bo Sundman, V Swamy, A Kussmaul, P J. Spencer, T J. Anderson, T G. Chart, A Costa e Silva, B Jansson, B J. Lee, M Schalin
The strongly related nature of the topics allocated to Groups 4 and 5 was such that a close interaction between the two groups appeared essential at all stages

An XML Namespace for IUPAC

Author(s)
Stephen E. Stein
The author presented two talks at the IUPAC/CAS conference of Chemical identifiers and XML in Chemistry, on July 1, 2002 in Columbus Ohio. He will be sending

Scanning Electron Microscope Analog of Scatterometry

Author(s)
John S. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek
Optical scatterometry has attracted a great deal of interest for linewidth measurement due to its high repeatability and capability of measuring sidewall shape

InGaAsP Ex-situ characterization

Author(s)
Alexana Roshko, Kristine A. Bertness
An interlaboratory comparison has been undertaken of X-ray and photoluminescence measurements of InGaAsP on InP. Six 1 cm 2 specimens are being measured, with

The Challenge of Nanometrology

Author(s)
Michael T. Postek
The promise and challenge of nanotechnology is immense. The National Nanotechnology Initiative provides an opportunity to develop a new technological base for U

A Facility for Nanoscience Research: An Overview

Author(s)
Joseph A. Stroscio, E Hudson, Steven R. Blankenship, Robert Celotta, Aaron P. Fein
We describe the development of an experimental system, consisting of a low temperature scanning tunneling microscope coupled to UHV tip and sample preparation
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