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Amazing Stories of Measurement: Forensic DNA

John Butler (NIST) discusses forensic DNA quality and metrology at the 2015 NCSL International (NCSLI) Workshop and Symposium in Grapevine, Texas.

Amazing Stories of Measurement: Forensic DNA
Amazing Stories of Measurement: Forensic DNA

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Created October 6, 2017, Updated August 15, 2025
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