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Nhan Van Nguyen

Dr. Nguyen is a physicist in the NanoScale Spectroscopy Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He joined the Semiconductor Electronics Division at NIST as a National Research Postdoctoral Fellow in 1990 and became a permanent research staff in 1992. He received his B. S degree from the University of Wisconsin – River Falls, and his Ph. D. from the Pennsylvania State University, in Physics in 1984 and 1989, respectively. His research interest involves the investigation of optical and electro-optical properties of semiconductor and dielectric thin films and their interfaces that are technologically important. He is well experienced in optical metrology instrumentation and data analysis. He was awarded the U.S. Department of Commerce Silver Medal Award 2014.

Publications

Efficient hybrid mixed-ion perovskite photovoltaics: in situ diagnostics of the roles of cesium and potassium alkali cation addition

Author(s)
Ming Chun Tang, Yuanyuan Fan, Dounya Barrit, Ruipeng Li, Hoang X. Dang, Siyuan Zhang, Timothy J. Magnanelli, Nhan V. Nguyen, Edwin J. Heilweil, Christina A. Hacker, Detlet-M Smilgies, Kui Zhao, Aram Amassian, Thomas D. Anthopoulos
Perovskite photovoltaics have made extraordinary progress in efficiency and stability in the past few years owing to process and formulation developments like

Dielectric properties of Nb_{x}W_{1-x}Se_{2} alloys

Author(s)
Albert F. Rigosi, Heather M. Hill, Sergiy Krylyuk, Nhan V. Nguyen, Angela R. Hight Walker, Albert Davydov, David B. Newell
The growth of transition metal dichalcogenide (TMDC) alloys provides an opportunity to experimentally access information elucidating how optical properties
Created October 9, 2019