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Michael H. Kelley (Assoc)

Dr Michael H Kelley is Chief of the RF Technology Division in NIST's Communications Technology Laboratory (CTL). This Division develops measurement science necessary for the advancement of RF and microwave electronic and electromagnetic technologies. Programs develop and disseminate metrology needed for accurate and traceable measurements of electromagnetic quantities that characterize the properties and performance of materials, devices, instruments and systems throughout the radio-frequency spectrum.

Previously, Mike has served as served as Chief of the NIST Electromagnetics and Quantum Electrical Metrology Divisions, served as the interim NIST Boulder Laboratory Operations Director, led the NIST programs in Fundamental Electrical Measurements, and carried out basic research within the NIST Physical Measurements Laboratory.  

Mike received his Ph.D. in Physics from the University of Texas at Austin and received a Fulbright Fellowship for study at the University of Kaiserslautern in Germany. Mike enjoys hiking, snowshoeing, classical music, and has been known to enjoy finding and sharing fine wines.

Publications

Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance

Author(s)
John Unguris, D. Tulchinsky, Michael H. Kelley, Julie Borchers, Joseph Dura, Charles Majkrzak, S. Y. Hsu, R. Loloee, W. P. Pratt, J. Bass
The magnetic microstructure responsible for the metastable high resistance state of weakly coupled, as-prepared [Co(6nm)/Cu(6nm)] 20 multilayers was analyzed

Towards More Effective Spectrum Test

Author(s)
Alan D. Skillicorn, Michael H. Kelley, Thomas J. Taylor, Eric Nelson
In response to the Presidential Memorandum on Wireless Innovation and the recommendation of the Presidential Council of Advisors on Science and Technology

The Electronic Kilogram

Author(s)
Michael H. Kelley
The kilogram is the only remaining base unit in the International System of Units (SI) whose definition is based on a single physical artifact rather than on

Future Voltage Metrology at NIST

Author(s)
Yi-hua D. Tang, June E. Sims, Michael H. Kelley
Presently NIST uses a voltage calibration path to maintain the U.S. legal volt and provide for the dissemination of an internationally consistent, accurate

Techniques to Measure Magnetic Domain Structures

Author(s)
Robert Celotta, John Unguris, Michael H. Kelley, Daniel T. Pierce
A summary of the current techniques for magnetic domain imaging of materials, including the practical aspects of each technique, the requirements on the sample
Created August 4, 2019, Updated December 8, 2022