Marcus Mendenhall

Staff Employment

1986-2014: Vanderbilt University in Nashville, TN, working on various physics and electrical engineering projects. In the early 1990s he was the Associate Director for Operations of the Vanderbilt/Keck Medical Free Electron Laser Center, an international user facility providing mid-infrared laser light for a wide variety of physics, chemistry, and medicine research. More recently, he worked with the Vanderbilt Radiation Effects Research (RER) group, and the Institute for Space and Defense Electronics (ISDE) carrying out experimental and computational work on radiation effects in semiconductor devices.

1985-1986: NATO Postdoctoral Fellow at the Centre de Spèctrométrie Nucléaire et Spèctrométrie de Masse (CSNSM) at the Université de Paris Sud (Orsay, France)

1984-1985: Department of Physics, Vanderbilt University

Staff Education

Marcus Mendenhall completed his undergraduate AB degree in Physics at Washington University in St. Louis in 1979. He completed an MS in Physics in 1981 and a PhD in Physics in 1983 at the California Institute of Technology, studying adhesion effects induced by high-energy ion radiation applied to thin films.

Areas of Expertise

Publications

Determination of Physically Based Pseudo-Voigt Powder Diffraction Profile Terms from the Fundamental Parameters Approach

April 4, 2022

Author(s)

Jonathan Denney, Gerard Mattei, Marcus Mendenhall, James Cline, Peter Khalifah, Brian Toby

Abstract Abstract A methodology is developed where a fundamental parameters approach (FPA) description of a laboratory powder diffraction instrument (configured

The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra

March 9, 2022

Author(s)

Csilla Szabo-Foster, James Cline, Albert Henins, Lawrence T. Hudson, Marcus Mendenhall

The NIST Vacuum Double-Crystal Spectrometer (VDCS) has been modernized and is now capable of recording reference-free wavelength-dispersive spectra in the 2 keV

Polarization Effects of X-ray Monochromators Modeled Using Dynamical Scattering Theory

July 1, 2021

Author(s)

Marcus Mendenhall, David R. Black, Donald Windover, James Cline

The difference in the diffracted intensity of the sigma-and pi-polarized components of an X-ray beam in powder diffraction has generally been treated according

The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

July 31, 2020

Author(s)

James Cline, Marcus Mendenhall, Joseph J. Ritter, David R. Black, Albert Henins, John E. Bonevich, Pamela S. Whitfield, James J. Filliben

This rather long-standing project has resulted in a National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) for the analysis of

CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

May 31, 2020

Author(s)

David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of

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Staff Employment

1985-1986: NATO Postdoctoral Fellow at the Centre de Spèctrométrie Nucléaire et Spèctrométrie de Masse (CSNSM) at the Université de Paris Sud (Orsay, France)

1984-1985: Department of Physics, Vanderbilt University

Staff Education

Areas of Expertise

Marcus Mendenhall (Fed)

Publications