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The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra

Published

Author(s)

Csilla Szabo-Foster, James Cline, Albert Henins, Lawrence T. Hudson, Marcus Mendenhall

Abstract

The NIST Vacuum Double-Crystal Spectrometer (VDCS) has been modernized and is now capable of recording reference-free wavelength-dispersive spectra in the 2 keV to 12 keV x-ray energy range. The VDCS employs crystals in which the lattice spacings are traceable to the definition of the meter through x-ray optical interferometry with a relative uncertainty <10e8. VDCS wavelength determination relies upon precision angle difference measurements for which the encoders of the rotation stages have been calibrated using the circle closure method for accurate, absolute angle measurement. The new vacuum-compatible area detector allows quantification of the aberration functions contributing to the observed line shape and in situ alignment of the crystal optics. This latter procedure is augmented with the use of a thin lamella as the first crystal. With these new techniques, x-ray spectra are registered with the VDCS on an absolute energy scale with a relative uncertainty of 10e−6
Citation
Journal of Research (NIST JRES) -
Volume
126

Keywords

double-crystal spectrometer, wavelength standards, x-ray spectroscopy, x-ray transition energies

Citation

Szabo-Foster, C. , Cline, J. , Henins, A. , Hudson, L. and Mendenhall, M. (2022), The NIST Vacuum Double-Crystal Spectrometer: A Tool for SI-Traceable Measurement of X-Ray Emission Spectra, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/jres.126.049, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933292 (Accessed August 14, 2022)
Created March 9, 2022