Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Kevin K Jurrens (Fed)

Kevin Jurrens is the Deputy Chief of the Intelligent Systems Division (ISD) in the Engineering Laboratory (EL) of the National Institute of Standards and Technology (NIST). Kevin is a mechanical engineer and has served in a variety of technical and management roles at NIST, including Deputy Chief (1998-2010) and Acting Chief (2003-2010) of the former Manufacturing Metrology Division, Program Manager of the NIST Predictive Process Engineering program (2000-2004), Technical Chair of the 1999 Manufacturing Panel for the NIST Advanced Technology Program (ATP), member of the NIST Patent Review Committee (2010-present), and technical project leader for several efforts. As the ISD Deputy Chief, Kevin provides management and leadership for the division's technical activities and staff and carries out activities associated with the division's day-to-day operations.

Kevin's current technical contribution at NIST is advancement of measurement science for the additive manufacturing (AM) industry. Kevin has been involved in rapid prototyping and additive manufacturing since the mid-1990s, contributing to both the 1998 and 2009 industry roadmaps. He currently serves on the Executive Committee for the ASTM F42 standards committee on Additive Manufacturing Technologies and as the NIST representative for both the National Additive Manufacturing Innovation Institute (NAMII) and the Additive Manufacturing Consortium (AMC).

In prior NIST research and international standards activities, Kevin contributed to machining process metrology and modeling, standardized data representations for machine tool and cutting tool information, reverse engineering technologies for component repair and replacement, and development of the international STEP (ISO 10303) standard for product definition data.

Prior to coming to NIST, Kevin worked as a mechanical engineer at Allied-Signal (now Honeywell) in Kansas City, MO from 1986 - 1990.


Strategic Opportunities for U.S. Semiconductor Manufacturing

Anita Balachandra, David Gundlach, Paul D. Hale, Kevin K. Jurrens, R Joseph Kline, Tim McBride, Ndubuisi George Orji, Sanjay (Jay) Rekhi, Sivaraj Shyam-Sunder, David G. Seiler
Semiconductors are critical to our Nation's economic growth, national security, and public health and safety. Revolutionary advances in microelectronics

An Additive Manufacturing Test Artifact

Shawn P. Moylan, John A. Slotwinski, A L. Cooke, Kevin K. Jurrens, M A. Donmez
We propose a test artifact, intended for standardization, for the purpose of evaluating the performance of additive manufacturing (AM) systems. A thorough

A Review of Test Artifacts for Additive Manufacturing

Shawn P. Moylan, April L. Cooke, Kevin K. Jurrens, John A. Slotwinski, M A. Donmez
A standardized test part can be used to quantitatively evaluate the performance of a machine or process. This document reviews existing test artifacts used to
Created October 9, 2019, Updated December 8, 2022