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James P. Cline (Fed)

Project Leader, Diffraction Metrology and Standards

Jim Cline’s work at NIST is focused primarily on the certification of Standard Reference Materials for use with powder diffraction techniques.  A central issue is the linking of diffraction measurements to the fundamental units of length, the Système international, through the certification of crystallographic lattice dimensions.   Additional issues addressed by the suite of diffraction SRMs include crystalline phase quantification, measurement of amorphous content, instrument characterization and microstructure analyses.  The  Diffraction Metrology and Standards program entails the development of equipment, data analysis techniques and the engineering of microstructures that are specific to the requirements of SRMs that can effectively serve the diffraction community.


DOC Silver Medal, 2014 


The NIST Silicon Lattice Comparator Upgrade

Marcus Mendenhall, James Cline, Csilla Szabo-Foster, Albert Henins
The NIST Silicon lattice comparator has ben in service in various forms since the 1970s. It is capable of measuring the difference in lattice spacing between
Created October 9, 2019, Updated December 8, 2022