Jim Cline’s work at NIST is focused primarily on the certification of Standard Reference Materials
for use with powder diffraction techniques. A central issue is the linking of diffraction measurements to the fundamental units of length, the Système international
, through the certification of crystallographic lattice dimensions. Additional issues addressed by the suite of diffraction SRMs include crystalline phase quantification, measurement of amorphous content, instrument characterization and microstructure analyses. The Diffraction Metrology and Standards
program entails the development of equipment, data analysis techniques and the engineering of microstructures that are specific to the requirements of SRMs that can effectively serve the diffraction community.