An official website of the United States government
The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.
The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.
Develop and customize instrumentation for atomic force microscopy to enable advanced and reliable nanoscale property characterization, with direct applications in nanoelectronics, micro- and nano-electromechanical systems, and biotechnology.
Atomic force microscopy based characterization of the structure-mechanical property relationship at the nanoscale. Interrogate the size-dependence of the elastic moduli of structures of reduced dimensionality.
Develop contact resonance atomic force microscopy (CR-AFM) for nanoscale elastic modulus measurements. Assess the suitability of CR-AFM in performing quantitative measurements on materials with elastic moduli in the range of GPa to hundreds of GPa.
US Patent # 9,535,085 "Intermittent Contact Resonance Atomic Force Microscopy and Process for Intermittent Contact Resonance Atomic Force Microscopy," Inventors: Stan & Gates (2017)