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Develop and customize instrumentation for atomic force microscopy to enable advanced and reliable nanoscale property characterization, with direct applications in nanoelectronics, micro- and nano-electromechanical systems, and biotechnology.
Atomic force microscopy based characterization of the structure-mechanical property relationship at the nanoscale. Interrogate the size-dependence of the elastic moduli of structures of reduced dimensionality.
Develop contact resonance atomic force microscopy (CR-AFM) for nanoscale elastic modulus measurements. Assess the suitability of CR-AFM in performing quantitative measurements on materials with elastic moduli in the range of GPa to hundreds of GPa.
US Patent # 9,535,085 "Intermittent Contact Resonance Atomic Force Microscopy and Process for Intermittent Contact Resonance Atomic Force Microscopy," Inventors: Stan & Gates (2017)
Samantha Hagerty, Yasmine C. Daniels, Melissa Singletary, Oleg Pustovyy, Ludmila Globa, William A. MacCrehan, Shinichiro Muramoto, June W. Lau, Edward Morrison, Iryna Sorokulova, Vitaly Vodyanoy, Gheorghe NMN Stan
Electrical responses of olfactory sensory neurons to odorants were examined in the presence of zinc nanoparticles of various sizes and degrees of oxidation. The