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David Long (Fed)

Project Leader

Dr. David A. Long is a project leader in the Material Measurement Laboratory at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. His research applies cutting-edge spectroscopic techniques to present problems in optical metrology, instrumental development, and atmospheric science. He is actively working on optical frequency comb development and applications in direct frequency comb spectroscopy as well as the development of ultrasensitive, frequency-agile spectroscopic approaches. Other areas of interest include molecular and atomic spectroscopy, cavity optomechanics, and remote sensing.

Research Interests

  • Molecular spectroscopy
  • Instrument development
  • Cavity-enhanced techniques
  • Optical frequency combs
  • Remote sensing
  • Greenhouse gas monitoring
  • Atmospheric chemistry

Awards

  • National Science Foundation Graduate Fellowship (2007)
  • National Defense Science and Engineering Fellowship (2007)
  • USA Today All-College Team Honorable Mention (2007)
  • Finalist for the Rhodes and Marshall Fellowships (2007)
  • Graduated as valedictorian and summa cum laude from Kenyon College (2007)
  • Morris K. Udall Scholarship (2006)
  • Barry M. Goldwater Scholarship (2005)

Full List of Publications

Publications

Intrinsically accurate sensing with an optomechanical accelerometer

Author(s)
Benjamin Reschovsky, David Long, Feng Zhou, Yiliang Bao, Richard A. Allen, Jason J. Gorman, Thomas W. LeBrun
We demonstrate a microfabricated optomechanical accelerometer that is capable of percent-level accuracy without external calibration. To achieve this capability

Patents (2018-Present)

Created September 10, 2019, Updated December 8, 2022