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David Long (Fed)

Project Leader

Dr. David A. Long is a project leader in the Material Measurement Laboratory at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. His research applies cutting-edge spectroscopic techniques to present problems in optical metrology, instrumental development, and atmospheric science. He is actively working on optical frequency comb development and applications in direct frequency comb spectroscopy as well as the development of ultrasensitive, frequency-agile spectroscopic approaches. Other areas of interest include molecular and atomic spectroscopy, cavity optomechanics, and remote sensing.

Research Interests

  • Molecular spectroscopy
  • Instrument development
  • Cavity-enhanced techniques
  • Optical frequency combs
  • Remote sensing
  • Greenhouse gas monitoring
  • Atmospheric chemistry

Awards

  • Presidential Early Career Award for Scientists and Engineers (PECASE) (2019)

  • NIST Sigma Xi Katherine B. Gebbie Young Scientist Award (2018)

  • National Science Foundation Graduate Fellowship (2007)
  • National Defense Science and Engineering Fellowship (2007)
  • USA Today All-College Team Honorable Mention (2007)
  • Finalist for the Rhodes and Marshall Fellowships (2007)
  • Graduated as valedictorian and summa cum laude from Kenyon College (2007)
  • Morris K. Udall Scholarship (2006)
  • Barry M. Goldwater Scholarship (2005)

Publications

Optical-cavity-based primary sound standard

Author(s)
Akobuije Chijioke, Richard A. Allen, Steven E. Fick, David Long, Benjamin Reschovsky, Jared Strait, Randall P. Wagner
We propose an optical sound standard in which the sound pressure is directly measured by using an optical cavity to observe the induced change in the refractive

Intrinsically accurate sensing with an optomechanical accelerometer

Author(s)
Benjamin Reschovsky, David Long, Feng Zhou, Yiliang Bao, Richard A. Allen, Jason J. Gorman, Thomas W. LeBrun
We demonstrate a microfabricated optomechanical accelerometer that is capable of percent-level accuracy without external calibration. To achieve this capability

Patents (2018-Present)

OPTOMECHANICAL ACCELEROMETER AND PERFORMING OPTOMECHANICAL ACCELEROMETRY

NIST Inventors
Jason J. Gorman , Thomas W. LeBrun and David Long
An optomechanical accelerometer includes: a fiducial mass for a microscale Fabry-Perot optical cavity; a proof mass for the microscale Fabry-Perot optical cavity, such that the proof mass oscillates in a displacement motion toward and away from the fiducial mass in response to acceleration of the

OPTOMECHANICAL ULTRASOUND DETECTOR AND PERFORMING ULTRASOUND IMAGING

NIST Inventors
David Long , Thomas W. LeBrun and Jason J. Gorman
An optomechanical ultrasound detector includes: a micromirror substrate; a mechanical resonator that receives ultrasound waves, oscillates at resonator frequency f.sub.r, changes cavity length L.sub.c, and produces intra-cavity light; and an optical microcavity between the micromirror substrate and
Created September 10, 2019, Updated June 13, 2023