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Daniel Sunday (Fed)

Research Interests

  • Development of x-ray techniques for periodic nanostructures
  • Soft x-ray scattering for the characterization of self-assembled materials
  • Block-copolymer lithography
  • Soft x-ray reflectivity for characterizing complex thin films
  • Nanoparticle self-assembly


Directed Self-Assembly

Awards and Honors

NRC Postdoctoral Fellowship, 2011

Selected Publications

Sunday, D. F.; Hammond, M. R.; Wang, C.; Wu, W.; Delongchamp, D. M.; Tjio, M.; Cheng, J. Y.; Pitera, J. W.; Kline, R. J. "Determination of the Internal Morphology of Nanostructures Patterned by Directed Self Assembly" ACS Nano 2014, 8(8), 8426-8437.

Sunday, D. F.; Hammond, M. R.; Wang, C.; Wu, W.; Stein, G.E.; Kline, R. J. "Three-dimensional x-ray metrology for block copolymer lithography line-space patterns" JM3 2013, 12(3), 031103.

Sunday, D. F.; Ilavsky, J.; Green, D.L.; "A Phase Diagram for Polymer Grafted Nanoparticles in Polymer Matrices" Macromolecules 2012, 45(9), 4007-4011.


Defining Chi for Block Copolymer Lithography

Whitney Loo, Hongbo Feng, Thomas Ferron, Ricardo Ruiz, Daniel Sunday, Paul Nealey
Block copolymer lithography, such as directed self-assembly, requires the design of nanostructured block copolymers with precise values of segregation strength

Polarized X-ray scattering measures molecular orientation in polymer-grafted nanoparticles

Subhrangsu Mukherjee, Dean DeLongchamp, Eliot Gann, Daniel Sunday, Lee J. Richter, Jason Streit, Richard A. Vaia, Baskar Ganapathysubramanian, Kumar Saurabh, Adarsh Krishnamurthy
Polymer chains are attached to nanoparticle surfaces for many purposes, including altering solubility, influencing aggregation, dispersion, and even tailoring

Patents (2018-Present)

Created October 9, 2019, Updated December 8, 2022