Dan Schmidt

Dan Schmidt is a research physicist and Group Leader in the Quantum Sensors Division within the Physical Measurement Laboratory. The Device Fabrication Group focuses on the micro-fabrication of sensors and readout that utilize superconducting phenomena. Additionally, the group develops advanced packaging for a broader range of devices. Dan holds multiple patents related to research at NIST and has received several awards including NIST/DOC Bronze and Silver medals.

Publications

Direct Observation of muonic molecules in resonance states critical to muon catalyzed fusion

April 15, 2026

Author(s)

Yuichi Toyama, Toshiyuki Azuma, Douglas Bennett, William Doriese, Malcolm Durkin, Joseph Fowler, Johnathon Gard, Tadashi Hashimoto, Ryota Hayakawa, Yuto Ichinohe, Katsuhiko Ishida, Sohtaro Kanda, Naritoshi Kawamura, Yasushi Kino, Ren Konishi, Yasuhiro Miyake, Kelsey Morgan, Ryota Nakashima, Hiroaki Natori, Hirofumi Noda, Galen O'Neil, Shinji Okada, Takuma Okumura, Kenichi Okutsu, Carl Reintsema, Kyosuke Sasaki, Toshiki Sato, Daniel Schmidt, Kouichiro Shimomura, Patrick Strasser, Daniel Swetz, Tadayuki Takahashi, Motonobu Tampo, Hideyuki Tatsuno, Joel Ullom, Izumi Umegaki, Shin Watanabe, Shinya Yamada, Takuma Yamashita

A Transition-edge Sensor Spectrometer for Precision Spectroscopy of Antiprotonic Ato ms

March 9, 2026

Author(s)

Kelsey Morgan, Toshiyuki Azuma, Gonçalo Baptista, Daniel Becker, Douglas Bennett, Francois Butin, Jonathan Dean, Ofir Eizenberg, Joseph Fowler, Hiroyuki Fujioka, davide gamba, Johnathon Gard, Nabil Garroum, Mauro Guerra, Tadashi Hashimoto, Takashi Higuchi, Paul Indelicato, Mark Keller, Jorge Machado, John Mates, Nathan Nakamura, Jason Nobles, Francois Nez, Ben Ohayon, Shinji Okada, Nathan Ortiz, Nancy Paul, Shikha Rathi, Michael Roosa, Takeshi Saito, Daniel Schmidt, Quentin Senetaire, Jonas Sommerfeldt, Paul Szypryt, Joel Ullom, Pauline Yzombard, Marco Zito, Daniel Swetz

Considerations for massic activity determination by Decay Energy Spectrometry (DES) using cryogenic Transition Edge Sensors (TES)

February 3, 2026

Author(s)

Max Carlson, Bradley Alpert, Denis Bergeron, Sean Jollota, Svetlana Nour, Galen O'Neil, Daniel Schmidt, Shinichiro N. Muramoto, Jason Nobles, Robert Verkouteren, Ryan Fitzgerald

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Patents (2018-Present)

Superconducting Multi-layer Transition-edge Sensor And Hybrid Subtractive-additive Production Of A Superconducting Multi-layer Transition-edge Sensor

NIST Inventors

Dan Schmidt and Joel Weber

A method of producing a superconducting multi-layer transition sensor in which the first layer of the multilayer is deposited and patterned completely with a subtractive process before the subsequent layers are deposited and patterned using separate additive processes.

Hybrid Subtractive-Additive Method Of Producing A Superconducting Multi-Layer Transition-Edge Sensor

NIST Inventors

Dan Schmidt and Joel Weber

The proposed invention is a method of producing a superconducting multi-layer transition-edge sensor in which the first layer of the multi-layer is deposited and patterned completely with a subtractive process before the subsequent layers deposited and patterned using separate additive processes

Recessed Carbon Nanotube Article and Method for Making Same

NIST Inventors

Chris Yung , Nathan A Tomlin and Dan Schmidt

A microbolometer structure including carbon nanotubes, a substrate (silicon, alumina, etc.) with an array of micromachined wells/holes/pockets, a weak thermal link (membrane or legs) at the base of each well/hole/pocket, a protection layer bonded to substrate over the wells for subsequent back side

X-Ray Spectrometer

NIST Inventors

Kevin L. Silverman , Carl D. Reintsema , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom and Ralph Jimenez

This invention includes: an x-ray plasma source that produces primary x-rays; an x-ray optic that transmits and focuses the primary x-ray onto a sample jet from which fluorescence x-ray are emitted; and a microcalorimeter array detector that measures the energy of the incoming fluorescence x-rays

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Dan Schmidt (Fed)

Publications

Patents (2018-Present)