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Dan Schmidt (Fed)

Dan Schmidt is a research physicist and Group Leader in the Quantum Sensors Division within the Physical Measurement Laboratory. The Device Fabrication Group focuses on the micro-fabrication of sensors and readout that utilize superconducting phenomena. Additionally, the group develops advanced packaging for a broader range of devices. Dan holds multiple patents related to research at NIST and has received several awards including NIST/DOC Bronze and Silver medals.

Publications

Few-electron highly charged muonic Ar atoms verified by electronic K xrays

Author(s)
Takuma Okumura, Toshiyuki Azuma, Douglas Bennett, W. Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Johnathon Gard, Tadashi Hashimoto, Ryota Hayakawa, Yuto Ichinohe, Paul Indelicato, Tadaaki Isobe, Sohtaro Kanda, Daiji Kato, Miho Katsuragawa, Naritoshi Kawamura, Yasushi Kino, Nao Kominato, Yasuhiro Miyake, Kelsey Morgan, Hirofumi Noda, Galen O'Neil, Shinji Okada, Kenichi Okutsu, Nancy Paul, Carl D. Reintsema, Toshiki Sato, Dan Schmidt, Kouichiro Shimomura, Patrick Strasser, Daniel Swetz, Tadayuki Takahashi, Shinichiro Takeda, Soshi Takeshita, Motonobu Tampo, Hideyuki Tatsuno, Tong Xiao-Min, Joel Ullom, Shin Watanabe, Shinya Yamada, Takuma Yamashita
Electronic K x rays emitted by muonic Ar atoms in the gas phase were observed using a superconducting transition-edge-sensor microcalorimeter. The high

Effects of Stray Magnetic Field on Transition-edge Sensors in Gamma-ray Microcalorimeters

Author(s)
Mark Keller, Abigail Wessels, Dan Becker, Douglas Bennett, Matthew Carpenter, Mark Croce, Jozsef Imrek, Johnathon Gard, John Mates, Kelsey Morgan, Nathan Ortiz, Dan Schmidt, Katherine Schreiber, Daniel Swetz, Joel Ullom
Superconducting transition-edge sensors (TESs) used in x-ray and γ-ray microcalorimeters suffer degraded performance if cooled in a magnetic field B sufficient

Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer

Author(s)
Nathan Nakamura, Paul Szypryt, Amber Dagel, Bradley Alpert, Douglas Bennett, W.Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Dylan Fox, Johnathon Gard, Ryan Goodner, James Zachariah Harris, Gene C. Hilton, Edward Jimenez, Burke Kernen, Kurt Larson, Zachary H. Levine, Daniel McArthur, Kelsey Morgan, Galen O'Neil, Christine Pappas, Carl D. Reintsema, Dan Schmidt, Peter Schulz, Daniel Swetz, Kyle Thompson, Joel Ullom, Leila R. Vale, Courtenay Vaughan, Christopher Walker, Joel Weber, Jason Wheeler
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but it is difficult to implement due to the competing

Patents (2018-Present)

Recessed Carbon Nanotube Article and Method for Making Same

NIST Inventors
Chris Yung , Nathan A Tomlin and Dan Schmidt
A microbolometer structure including carbon nanotubes, a substrate (silicon, alumina, etc.) with an array of micromachined wells/holes/pockets, a weak thermal link (membrane or legs) at the base of each well/hole/pocket, a protection layer bonded to substrate over the wells for subsequent back side
X-Ray Spectrometer

X-Ray Spectrometer

NIST Inventors
Kevin L. Silverman , Carl D. Reintsema , Galen O'Neil , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom and Ralph Jimenez
This invention includes: an x-ray plasma source that produces primary x-rays; an x-ray optic that transmits and focuses the primary x-ray onto a sample jet from which fluorescence x-ray are emitted; and a microcalorimeter array detector that measures the energy of the incoming fluorescence x-rays
Created October 9, 2019, Updated June 5, 2024