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Craig Copeland (Fed)

Craig Copeland is a Research Scientist in the Microsystems & Nanotechnology Division. He received a B.S. in Physics from the University of Maryland, Baltimore County and an M.A. and Ph.D. in Physics from The Johns Hopkins University. At Johns Hopkins, he developed devices and methods for applying and measuring forces in single-cell systems. His current research focuses on the design and characterization of reference materials and calibration methods for localization microscopy, and developing measurement methods for microelectromechanical systems, nanofabrication processes, nanoparticle characterization, and cancer diagnostics.

Selected Publications

  • Heterotypic cell pair co-culturing on patterned microarrays, E. J. Felton, C. R. Copeland, C. S. Chen, and D. H. Reich, Lab on a Chip 12, 3117–3126 (2012).
  • Mechanical Coupling Between Myofibroblasts and Cardiomyocytes Slows Electric Conduction in Fibrotic Cell Monolayers, S. A. Thompson, C. R. Copeland, D. H. Reich, and L. Tung, Circulation 123, 2083–U71 (2011).

Publications

Sub-picoliter Traceability of Microdroplet Gravimetry and Microscopy

Author(s)
Lindsay C. C. Elliott, Adam L. Pintar, Craig R. Copeland, Thomas B. Renegar, Ronald G. Dixson, B. Robert Ilic, R. Michael Verkouteren, Samuel M. Stavis
Volumetric analysis of single microdroplets is difficult to perform by ensemble gravimetry, whereas optical microscopy is often inaccurate beyond the resolution

Patents

Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Patent Description Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over a submillimeter field. NIST fabricated arrays of sub-resolution apertures in an

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Patent Description Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over a submillimeter field. NIST fabricated arrays of sub-resolution apertures in an
Diagram of cells and other components within a blood vessel

Measuring a size distribution of nucleic acid molecules in a sample

NIST Inventors
Craig Copeland and Samuel M. Stavis
Patent Description This invention is a method for measuring the size of single nucleic-acid molecules. Measuring the size of nucleic-acid molecules is important in a variety of applications ranging from criminal forensics to clinical diagnostics. The invention advances conventional methods and
Created February 26, 2019, Updated July 11, 2022