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Search Patents by Craig Copeland

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 2 of 2
Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Performing critical-dimension localization microscopy includes: subjecting a first dimensional member and a second dimensional member of a reference artifact to critical-dimension metrology, the first and second dimensional members, in combination, including a critical dimension and each
Diagram of cells and other components within a blood vessel

Measuring a size distribution of nucleic acid molecules in a sample

NIST Inventors
Craig Copeland and Samuel M. Stavis
A process for measuring a size distribution of a plurality of nucleic acid molecules, the process comprising: labeling the nucleic acid molecules with a fluorescent dye comprising a plurality of fluorescent dye molecules to form labeled nucleic acid molecules, such that a number of fluorescent dyes
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