Patents

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 3 of 3

Sound Pressure Metrology Instrument And Determining Sound Pressure From Index Of Refraction

NIST Inventors

Richard A. Allen , Randall P Wagner , Benjamin Reschovsky and Akobuije Chijioke

A sound pressure metrology instrument determines sound pressure from index of refraction and includes: a light source that produces source light; the optical cavity that: receives an acoustic field from the sound source; receives the source light from the light source; produces acoustic-modified

Calibration Apparatus And Calibrating A Laser Doppler Vibrometer

NIST Inventors

Michael Gaitan , Benjamin Reschovsky and Akobuije Chijioke

A new approach to characterize the performance of a laser Doppler vibrometer (LDV). The method uses two acousto-optic modulators to frequency shift the light from an LDV by a known quantity to create a synthetic velocity shift that is traceable to a frequency reference. Results are presented for

Dynamic Force Contactor, Providing a Dynamic Force, and Calibrating a Force Sensor to be Traceable to the International System of Units

NIST Inventors

Akobuije Chijioke

A longstanding and thorny problem in force metrology is that of accurately measuring rapidly changing forces. A key part of the problem is that the dynamic response of force sensors changes depending on the system in which the sensor is used, meaning that an external calibration of the sensor is

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