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Search Patents by Stephen Eckel

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 4 of 4

Optical Refraction Barometer

NIST Inventors
Kevin O Douglass , Stephen Eckel , Jacob Edmond Ricker and Jay H. Hendricks
A new method for measuring refractivity-based pressure changes using a dual Fabry-Perot cavity utilizing a single laser with off-set sideband locking to the second cavity. The method thus far has shown sensitivity and resolution of 4 mPa.

Uniaxial Counter-Propagating Monolaser Atom Trap

NIST Inventors
Stephen Eckel , James A. Fedchak , Julia Scherschligt , Daniel Barker , Eric Norrgard and Nikolai Klimov
A uniaxial counter-propagating monolaser atom trap cools and traps atoms with a single a laser beam and includes: an atom slower that slows atoms to form slowed atoms; an optical diffractor including: a first diffraction grating that receives primary light and produces first reflected light; a
Image for 10,816,325

Deformometer for Determining Deformation of an Optical Cavity Optic

NIST Inventors
Zeeshan Ahmed , Kevin O Douglass , Stephen Eckel , Patrick Egan and Jay H. Hendricks
A superconducting waveform synthesizer produces an arbitrary waveform and includes an encoder that produces a bitstream; a pattern generator that produces a current bias pulse from the bitstream; a Josephson junction that produces a quantized output pulse from the current bias pulse; and a converter

Optomechanical Pressure Measurement System And Method Using The Vibrational Modes Of A Membrane

NIST Inventors
Stephen Eckel , James A. Fedchak , Thomas Purdy and Robinjeet Singh
An optomechanical pressure-measurement system measures pressure in the range of 10.sup.−6 Pa-10.sup.−2 Pa by measuring various properties of a vibrational mode of an ultra-thin membrane member. With independent measurements of the thickness and density of the membrane, in addition to the measured