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Numerical Modelling and the Uncertainty Analysis of Transistor Noise-Parameter Measurements
Published
Author(s)
James P. Randa
Abstract
This paper provides an overview of the use of noise parameters as a numerical model to represent the noise characteristics of transistors, particularly in the context of a Monte Carlo evaluation of the uncertainties in noise-parameter measurements. The Monte Carlo also relies on a numerical model of the measurement process, in order to generate simulated measurement results, and this numerical model is also reviewed.
Citation
International Journal of Numerical Modelling-Electronic Networks Devices and Fields
Randa, J.
(2014),
Numerical Modelling and the Uncertainty Analysis of Transistor Noise-Parameter Measurements, International Journal of Numerical Modelling-Electronic Networks Devices and Fields, [online], https://doi.org/10.1002/jnm.2039
(Accessed October 1, 2025)