Moyne, J.
, Parrott, J.
, Kalappa, N.
and Li-Baboud, Y.
(2006),
Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing, AEC/APC Symposium XVIII, Westminster, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32428
(Accessed October 13, 2025)
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Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing
Published
Author(s)
James Moyne, Jonathan Parrott, Naveen Kalappa,
Abstract
In this presentation, the practical aspects of implementing time synchronization in today?s fabs will be discussed utilizing experimental analysis of industrial quality networked environments to illustrate the impact of the various components on the time and data synchronization problem. A realistic assessment of what level of time synchronization can be achieved today will be given. Additionally recommendations will be provided on how to address the weak link of software delay and delay variability so as to improve the potential for node time synchronization.Proceedings Title
AEC/APC Symposium XVIII
Conference Dates
September 30-October 5, 2006
Conference Location
Westminster, CO, USA
Pub Type
Conferences
Download Paper
Keywords
data quality, IEEE 1588, network control systems, time synchronization
Citation
Issues
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Created September 29, 2006, Updated October 12, 2021