@conference{758356,
  author = {James Moyne and Jonathan Parrott and Naveen Kalappa and Ya-Shian Li-Baboud},
  title = {Practical Aspects Impacting Time Synchronization Data Quality in Semiconductor Manufacturing},
  year = {2006},
  month = {2006-09-30 00:09:00},
  publisher = {AEC/APC Symposium XVIII, Westminster, CO, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32428},
  language = {en},
}