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PUBLICATIONS

Knowledge Extraction Techniques for Expert System Assisted Wafer Screening

Published

Author(s)

D. Khera, Michael W. Cresswell, Loren W. Linholm, G. Ramanathan, J. Buzzeo, A. Nagarajan
Proceedings Title
Proc., International Semiconductor Manufacturing Science Symposium
Conference Dates
May 21-23, 1990
Conference Location
Burlingame, CA, USA
Pub Type
Conferences

Citation

Khera, D. , Cresswell, M. , Linholm, L. , Ramanathan, G. , Buzzeo, J. and Nagarajan, A. (1990), Knowledge Extraction Techniques for Expert System Assisted Wafer Screening, Proc., International Semiconductor Manufacturing Science Symposium, Burlingame, CA, USA (Accessed November 3, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1990, Updated October 12, 2021
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