Postek, M.
, Keery, W.
and Frederick, N.
(1990),
Development of a Low-Profile High-Efficiency Microchannel-Plate Detector System for SEM Imaging and Metrology, Proc., Scanning 90, Mahwah, NJ, USA
(Accessed May 16, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Development of a Low-Profile High-Efficiency Microchannel-Plate Detector System for SEM Imaging and Metrology
Published
Author(s)
, ,
Proceedings Title
Proc., Scanning 90
Conference Location
Mahwah, NJ, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1990, Updated October 12, 2021