Bertness, K.
(2000),
Smart pyrometry for combined sample temperature and reflectance measurements in molecular beam epitaxy, Proc. 18th North American Conf. on Molecular Beam Epitaxy (NAMBE 99), Banff, -1, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=6488
(Accessed October 28, 2025)
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Smart pyrometry for combined sample temperature and reflectance measurements in molecular beam epitaxy
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Author(s)
Abstract
Improved sample temperature measurement accuracy is demonstrated in a normal-incidence optical reflectance spectroscopy system that has been modified to allow rapid switching between the measurement of sample reflectance and sample emission.Proceedings Title
Proc. 18th North American Conf. on Molecular Beam Epitaxy (NAMBE 99)
Issue
11 2124-2130
Conference Dates
October 10-15, 1999
Conference Location
Banff
Pub Type
Conferences
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Keywords
in situ reflectance, molecular beam epitaxy, pyrometry, temperature measurement
Citation
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Created June 1, 2000, Updated January 27, 2020