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PUBLICATIONS

Investigation of the Threshold Voltage of MOSFETs with Position- and Potential- Dependent Interface Trap Distributions Using a Fixed-Point Iteration Method

Published

Author(s)

Michael Gaitan, I. D. Mayergoyz, C. E. Korman
Citation
IEEE Transactions on Electron Devices
Pub Type
Journals

Citation

Gaitan, M. , Mayergoyz, I. and Korman, C. (1990), Investigation of the Threshold Voltage of MOSFETs with Position- and Potential- Dependent Interface Trap Distributions Using a Fixed-Point Iteration Method, IEEE Transactions on Electron Devices (Accessed October 12, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created April 29, 1990, Updated October 12, 2021
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