Schafft, H.
, Suehle, J.
and Lechner, J.
(1992),
Measurement for Controlling Electromigration in Metallization Interconnects: Today and Tomorrow, Proc., Sixth International Conference on Interconnection Technology in Electronics, Fellbach, 1, GM
(Accessed May 16, 2024)
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Measurement for Controlling Electromigration in Metallization Interconnects: Today and Tomorrow
Published
Author(s)
, , J. A. Lechner
Proceedings Title
Proc., Sixth International Conference on Interconnection Technology in Electronics
Conference Dates
February 18-20, 1992
Conference Location
Fellbach, 1, GM
Pub Type
Conferences
Citation
Issues
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Created December 30, 1992, Updated October 12, 2021