Analysis of Admixed CeO2 Nanoparticles via TEM and X-Ray Diffraction Techniques

Published

August 28, 2006

Author(s)

Andrew Vella, Rhys Whitley, N G. Armstrong, A Dowd, James Cline

Abstract

The techniques used to identify nanoparticle size and shape characteristics are of vital importance in the development of functional nanoparticles. Each technique offers different advantages; this work compares the two techniques of transmission electron microscopy (TEM) and X-ray diffraction (XRD) analysis by characterising CeO2 nanoparticle specimens. Whole Powder Pattern Modelling (WPPM) is used to quantify the specimen dislocations and size characteristics from XRD data. Using admixed samples we test and extend the techniques. We show that XRD accurately characterises small crystallite distributions and that larger crystallite distributions necessitate further investigation.

Proceedings Title

Annual Condensed Matter and Materials Meeting | 30th | | Australian Institute of Physics

Conference Dates

February 7-10, 2006

Conference Location

Wagga Wagga, 1, AS

Conference Title

Annual Condensed Matter and Materials Meeting

Pub Type

Conferences

Keywords

bimodal size distributions, crystallite size broadening, microstrain, TEM, X-ray diffraction

Citation

Vella, A. , Whitley, R. , Armstrong, N. , Dowd, A. and Cline, J. (2006), Analysis of Admixed CeO₂ Nanoparticles via TEM and X-Ray Diffraction Techniques, Annual Condensed Matter and Materials Meeting | 30th | | Australian Institute of Physics, Wagga Wagga, 1, AS (Accessed October 12, 2025)