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PUBLICATIONS

Polarized Neutron Reflectometry of w Patterned Magnetic Film with w 3He Analyzer and a Position Sensitive Detector

Published

Author(s)

W C. Chen, Thomas R. Gentile, K V. O'donovan, J A. Borchers, C F. Majkrzak
Citation
Review of Scientific Instruments
Volume
75
Pub Type
Journals

Citation

Chen, W. , Gentile, T. , O'donovan, K. , Borchers, J. and Majkrzak, C. (2004), Polarized Neutron Reflectometry of w Patterned Magnetic Film with w <sup>3</sup>He Analyzer and a Position Sensitive Detector, Review of Scientific Instruments (Accessed November 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 31, 2003, Updated October 12, 2021
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