Unguris, J.
, Scheinfein, M.
, Celotta, R.
and Pierce, D.
(1989),
Scanning Electron Microscopy with Polarization Analysis Studies of Ni-Fe Magnetic Memory Elements, IEEE Transactions on Magnetics, [online], https://doi.org/10.1109/20.42569, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=620343 (Accessed May 2, 2026)
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Scanning Electron Microscopy with Polarization Analysis Studies of Ni-Fe Magnetic Memory Elements
Published
Author(s)
john unguris, , ,
Abstract
This paper describes the use of Scanning Electron Microscopy with Polarization Analysis to quantitatively image the magnetic structure of permalloy magnetic memory elements. Various methods of determining the absolute magnitude and direction of the magnetization vector are described. The magnetic domain structures are observed as a function of ion milling time. During ion milling the surface composition is monitored by Auger analysis.Citation
IEEE Transactions on Magnetics
Volume
25
Issue
5
Pub Type
Journals
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Created January 1, 1989, Updated April 21, 2026