Lorincik, J.
, Fine, J.
and Gillen, J.
(1997),
The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging, Society of Photo-Optical Instrumentation Engineers, backfill, SC (Accessed May 12, 2026)
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The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging
Published
Author(s)
J Lorincik, J Fine,
Proceedings Title
Society of Photo-Optical Instrumentation Engineers
Conference Dates
February 11, 2009
Conference Location
backfill, SC
Conference Title
Proceedings of the Society of Photo-Optical Instrumentation Engineers
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created November 30, 1997, Updated October 12, 2021