McGuiggan, P.
and Yarusso, D.
(2003),
Measuring the Mechanical Properties of a Thin Polymeric Film by AFM, Polymer Preprints, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852142 (Accessed April 26, 2026)
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Measuring the Mechanical Properties of a Thin Polymeric Film by AFM
Published
Author(s)
, D J. Yarusso
Abstract
The atomic force microscope is used to measure the tan delta (loss modulus/storate modulus) of a thin film of poly(n-butylacrylate) as a function of frequency. The AFM results are in good agreement with indenter measurements. The results demonstrate that the AFM technique can quantitatively measure rheological properties of soft thin polymeric films.Citation
Polymer Preprints
Volume
88
Pub Type
Journals
Download Paper
Keywords
AFM, atomic force microscopy, mechanical properties, nanomechanics, poly(n-butylacrylate), thin films
Citation
Issues
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Created January 1, 2003, Updated February 19, 2017