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PUBLICATIONS

Trapping Highly Charged Ions: Fundamentals and Applications

Published

Author(s)

John D. Gillaspy

Abstract

Fundamentals and applications for trapping highly charged ions.
Citation
Trapping Highly Charged Ions: Fundamentals and Applications
Publisher Info
Nova Publisher, Hauppauge, NY
Pub Type
Books

Keywords

atoms, EBIT, electron beam ion trap, highly charged atoms
Physics

Citation

Gillaspy, J. (2000), Trapping Highly Charged Ions: Fundamentals and Applications, Nova Publisher, Hauppauge, NY (Accessed October 11, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created April 1, 2000, Updated February 19, 2017
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