Arz, U.
, Williams, D.
, Walker, D.
and Grabinski, H.
(2000),
Accurate Electrical Measurement of Coupled Lines on Lossy Silicon, 9th Elect. Perf. Elect. Pkg. Conf., Scottsdale, AZ, [online], https://doi.org/10.1109/EPEP.2000.895523
(Accessed October 11, 2025)
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Accurate Electrical Measurement of Coupled Lines on Lossy Silicon
Published
Author(s)
, , , Hartmut Grabinski
Abstract
In this paper we apply a measurement method designed for asymmetric coupled lines to determine the broadband propagation characteristics of symmetric coupled lines fabricated on a highly conductive silicon substrate. We show that the matrices of frequency-dependent propagation constants and characteristic impedances, as extracted from calibrated four-port S-parameter measurements, agree very well with data predicted by numerical calculations.Conference Dates
October 23-25, 2000
Conference Location
Scottsdale, AZ
Conference Title
9th Elect. Perf. Elect. Pkg. Conf.
Pub Type
Conferences
Download Paper
Keywords
characteristic impedance, coupling, measurement, silicon, substrate effect, transmission line
Citation
Issues
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Created October 1, 2000, Updated January 27, 2020