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PUBLICATIONS

Microstructural Characterization of Zirconia Coatings With Electron Microprobe Wavelength Dispersive Compositional Mapping

Published

Author(s)

Ryna B. Marinenko, Jennifer R. Verkouteren, David S. Bright

Abstract

The use of digital electron microprobe x-ray compositional mapping using wavelength dispersive spectrometers to understand the microstructure of yttria stabilized zirconia thermal barrier coatings is described. Data from quantification fo element x-ray maps can be utilized to infer what phase or phases are present. Analysis of a plasma-sprayed coating prepared from a fused and crushed feedstock is compared to an annealed specimen of the same material.
Proceedings Title
Material Reserach Society 2000 Fall Proceedings
Conference Dates
November 27-December 1, 1999
Conference Location
Boston, MA
Pub Type
Conferences

Keywords

electron microprobe, quantitative compostional mapping, x-ray compostional mapping
Chemistry and Composition and structure

Citation

Marinenko, R. , Verkouteren, J. and Bright, D. (2000), Microstructural Characterization of Zirconia Coatings With Electron Microprobe Wavelength Dispersive Compositional Mapping, Material Reserach Society 2000 Fall Proceedings , Boston, MA (Accessed October 18, 2025)

Issues

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Created January 1, 2000, Updated February 19, 2017
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