Tedesco, J.
, Gergel-Hackett, N.
, Stephey, L.
, Hacker, C.
and Richter, C.
(2010),
Advanced Capacitance Metrology for Nanoscale Device Characterization, Posters and Presentations (CD), McLean, VA (Accessed June 2, 2026)
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Advanced Capacitance Metrology for Nanoscale Device Characterization
Published
Author(s)
, , , ,
Proceedings Title
Posters and Presentations (CD)
Conference Dates
April 26-29, 2010
Conference Location
McLean, VA
Conference Title
Tenth Annual IC Postdoctoral Research Fellowship Program Colloquium
Pub Type
Conferences
Keywords
TiO2, Memristors, I-V, C-V, Nanoscale
Citation
Issues
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Created April 29, 2010, Updated February 19, 2017