Dvornychenko, V.
(2011),
Successful Design of Biometric Tests in a Constrained Environment, Applied Imagery Pattern Recognition Workshop (AIPR) 2010 IEEE 39th, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907662 (Accessed May 6, 2026)
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Successful Design of Biometric Tests in a Constrained Environment
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Abstract
The National Institute of Standards and Technology (NIST), with participation of the biometrics community, conducts evaluations of biometrics-based verification and identification systems. Among the more challenging is testing of automated latent fingerprints matchers. Since participation in these tests is voluntary, and at the expense of the participant, NIST needs to exercise moderation in what, and how much, software to be tested is requested. As a result, it may not be possible to design tests which cover and resolve all possible outcomes. Conclusions may have to be inferred from partial or ambiguous results.Proceedings Title
Applied Imagery Pattern Recognition Workshop (AIPR) 2010 IEEE 39th
Conference Dates
October 13-15, 2010
Conference Location
Washington, DC
Pub Type
Conferences
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Keywords
biometrics, fingerprints, latent fingerprints, matching, sutomated matching, SDKs
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Issues
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Created June 9, 2011, Updated February 19, 2017