TY  - CONF
AU  - Vladimir Dvornychenko
C2  - Applied Imagery Pattern Recognition Workshop (AIPR) 2010 IEEE 39th, Washington, DC
DA  - 2011-06-09
LA  - en
PB  - Applied Imagery Pattern Recognition Workshop (AIPR) 2010 IEEE 39th, Washington, DC
PY  - 2011
TI  - Successful Design of Biometric Tests in a Constrained Environment
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907662
ER  -