NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

High Speed Endurance and Switching Measurements for Memristive Switches

Published

Author(s)

Pragya R. Shrestha, Adaku Ochia, Kin P. Cheung, Jason P. Campbell, Helmut Baumgart, Gary Harris

Abstract

Accurate capture of the Set/Reset characteristics is a necessary but challenging task for the development of memristive switches. Here we describe and demonstrate a technique capable of meeting this challenge. This technique can measure the transient current during the Set/Reset operation with a rise time of 4 ns and simultaneously measure the OFF state resistance (Roff) to 1.6 GΩ and the ON state resistance (Ron) to less than 10 . It can also rapidly cycle through the sense states to study endurance. Solid electrolyte Pt/Ta2O5/Cu memristive switches (Ron/Roff ratio of >104) are used to highlight this new measurement capability.
Citation
Electrochemical and Solid State Letters
Volume
15
Issue
5
Pub Type
Journals

Download Paper

DOI Link
Semiconductors and Polymers

Citation

Shrestha, P. , Ochia, A. , Cheung, K. , Campbell, J. , Baumgart, H. and Harris, G. (2012), High Speed Endurance and Switching Measurements for Memristive Switches, Electrochemical and Solid State Letters, [online], https://doi.org/10.1149/2.002206esl (Accessed October 3, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 6, 2012, Updated November 10, 2018
Was this page helpful?