Lafferty, W.
, Flaud, J.
, Ben, A.
, Kwabia, F.
, Landsheere, X.
and Aroui, H.
(2012),
Absolute line intensities for ethylene from 1800 to 2350 cm-1., Journal of Molecular Spectroscopy, [online], https://doi.org/10.1016/j.jms.2012.11.001
(Accessed October 15, 2025)
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Absolute line intensities for ethylene from 1800 to 2350 cm-1.
Published
Author(s)
, Jean-Marie Flaud, A. Ben Hassen, F. K. Kwabia Tchana, X Landsheere, H Aroui
Abstract
Fourteen Fourier transform spectra of ethylene (C2H4) have been recorded in the 1800-2350 spectral domain with different path-lengths and pressures and used to derive individual line intensities for lines belonging to the ν7 + ν8, ν4 + ν8 , ν6 + ν10, ν6 + ν7, ν4 + ν6 and ν3 + ν10 bands. These line intensities were satisfactorily fit leading to accurate transition moment constants and a line list of positions and intensities has been generated.Citation
Journal of Molecular Spectroscopy
Volume
282
Pub Type
Journals
Download Paper
Keywords
ethylene, infrared line intensities, line atlas
Citation
Issues
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Created November 17, 2012, Updated November 10, 2018