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Metal-based additive manufacturing (AM) has the potential to transform critical industries including aerospace, defense, energy, and medical devices. However, widespread adoption remains limited by challenges in process understanding, qualification, and certification. A key barrier is the lack of reliable and validated in situ measurements capable of monitoring structural and microstructural evolution during AM processes.
In situ metrology enables real-time observation of thermal, structural, and material phenomena during metal AM fabrication, providing critical data to link process conditions with material structure and performance. This workshop will emphasize structural measurements during fabrication and processing, including measurements of phase evolution, microstructure development, and residual stress—information essential for model validation and process qualification.
This NIST workshop will bring together stakeholders from industry, academia, government, and national laboratories to identify key measurement science gaps and develop a community-informed roadmap for advancing in situ metrology in metal additive manufacturing. Outcomes will inform a NIST Special Publication outlining research priorities across metrology, data, artificial intelligence, and standards to support qualification-ready manufacturing and accelerate industrial adoption.
See the tentative schedule below. Agenda subject to change
Wednesday, April 29, 2026 | ||
| Time | Session | Speakers/Panelists/Breakouts |
| 8:45am - 8:55am | Welcome/Opening Remarks | Kate Beers (NIST) |
| 8:55am - 9:05am | Opening Remarks/Workshop Objectives | Fan Zhang (NIST) |
| 9:05am - 9:35am | Opening Keynote: Why In Situ Metrology Matters for Qualification-Ready Metal AM/Q+A | Suresh Babu (UMD) |
| 9:35am - 10:35am | In Situ Microstructure Measurements During Fabrication | Andrew Chuang (ANL); Samuel Clark (ANL); Kelly Nygren (Cornell) |
| 10:35am - 10:50am | BREAK | |
| 10:50am - 11:50am | Facility-Enabled Metrology: Synchrotron and Neutron Capabilities | Donald Brown (LANL); Arthur Woll (Cornell); Jon Almer (ANL) |
| 11:50am - 12:40pm | LUNCH | |
| 12:40pm - 1:00pm | Radiometric, Thermal, and Optical Approaches for In Situ Metrology in Metal Additive Manufacturing | David Deisenroth (NIST) |
| 1:00pm - 2:00pm | Process Monitoring and Sensing Beyond Beamlines | Nick Calta (LLNL); Chris Kube (PSU); Jian Cao (Northwestern) |
| 2:00pm - 2:45pm | What Measurements Are Actionable for Process Control and Qualification? | Panelists: Nick Calta, Jian Cao, Chris Kube, Matthew Dantin (NAVSEA), David Rowenhorst (NRL); Moderator: TBD |
| 2:45pm - 3:00pm | BREAK | |
| 3:00pm - 3:50pm | Highest-Priority Measurement Gaps | Breakout Session/Three Parallel Groups |
| 3:50pm - 4:30pm | Day 1 Breakout Report-Outs/Plenary Discussion | Breakout leads |
| 4:30pm - 5:30pm | Emerging Needs and Overlooked Methods | Eddie Gienger (APL); Uta Ruett (SLAC); Lianyi Chen (Wisconsin) |
| 5:30pm | ADJOURN | |
Thursday, April 30, 2026 | ||
| Time | Session | Speakers/Panelists/Breakouts |
| 9:00am - 9:15am | Opening Remarks/Recap of Day 1 | Igor Levin (NIST) |
| 9:15am - 10:15am | Metallurgy and Process–Structure Linkages | David Rowenhorst (NRL); Veera Sundararaghavan (Michigan) |
| 10:15am - 10:30am | BREAK | |
| 10:30am - 11:00am | Featured Talk: Model-Based Qualification and Certification/Q+A | Anthony Rollett (CMU) |
| 11:00am - 12:15pm | Modeling and Simulation for Qualification and Certification | Alex Plotkowski (ORNL); Gary Whelan (QuesTek); Paul Mason (Thermo-Calc) |
| 12:15pm - 1:10pm | LUNCH | |
| 1:10pm - 2:00pm | Data, AI, and Digital Infrastructure | Peter Beaucage (Lila Sciences); David Elbert (JHU) |
| 2:00pm - 2:50pm | Government and Mission-Driven Needs: What Evidence Would Build Trust Faster? | Panelists: Colton Katsarelis (NASA); Huijuan Dai (DOE); Alex Butler (ARL); Isabella van Rooyen (PNNL); Dava Keavney (DOE) Moderator: TBD |
| 2:50pm - 3:05pm | BREAK | |
| 3:05pm - 3:55pm | Roadmap Drafting Groups | Breakout Session/Four Parallel Groups |
| 3:55pm - 4:40pm | Day 2 Breakout Report-Outs and Cross-Group Discussion | Breakout leads |
| 4:40pm - 5:40pm | Qualification, Standards, and Industrial Adoption | James Sobotka (Southwest Research Institute); Lyle Levine (NIST); Iuliana Cernatescu (Pratt & Whitney) |
| 5:40pm | ADJOURN | |
Friday, May 1, 2026 | ||
| Time | Session | Speakers/Panelists/Breakouts |
| 9:00am - 9:30am | Top Priorities from Each Domain/Lightning Plenary Session | Breakout leads |
| 9:30am - 10:30am | End-User and Deployment Perspectives | Matthew Dantin (NAVSEA); Ben Brown (NNSA) |
| 10:30am - 10:45am | BREAK | |
| 10:45am - 11:15am | Final Keynote Talk: From In Situ Measurements to Qualification-Ready Manufacturing: A Roadmap Perspective/Q+A | Edward Glaessgen (NASA) |
| 11:15am - 11:45am | Ranking Roadmap Priorities | |
| 11:45am - 12:00pm | Workshop Closing Remarks: Inputs to the NIST Special Publication | Fan Zhang (NIST); Igor Levin (NIST) |
| 12:00pm | ADJOURN | |
A hotel block has been reserved at the following location:
Holiday Inn Gaithersburg
Two Montgomery Village Ave, Gaithersburg, MD 20879
Rate: $115 per night, excluding taxes and fees. Rate includes complimentary breakfast each day and shuttle.
CLICK HERE to book your room Last day to register is April 15, 2026.
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