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The National Institute of Standards and Technology (NIST) Communications Technology Laboratory (CTL) is advancing metrology and calibration services to support the next generation of measurement science. This roadmap initiative ensures that CTL calibration methodologies remain at the forefront of precision measurement, addressing emerging challenges in wireless communications, quantum technologies, and advanced manufacturing. By collaborating with industry, government, and academia, CTL is refining standards and developing new test methods that enhance measurement accuracy and interoperability. These efforts align with broader mission of NIST to provide reliable, traceable measurement solutions that drive innovation across critical technology domains.
Metrology and Calibration Services Roadmap Definition
Metrology and Calibration Services advance the precision and reliability of communications measurements, with a particular emphasis on calibration standards. This initiative supports accurately characterizing communication systems, such as signal integrity, frequency stability, and power measurements, ensuring all instruments and systems are traceable through a documented chain of calibrations to fundamental constants. By enhancing calibration practices and measurement assurance, these services improve stakeholder outcomes, strengthen interoperability, and bolster NIST research capabilities in developing and validating cutting-edge technologies such as next generation wireless technologies, quantum communications, and advanced semiconductors, and microwave materials. This effort ensures consistent and universally applicable measurement standards that support safety, performance, and mission-critical applications across diverse sectors.
CTL focuses on providing calibration services grounded in traceability to the International System of Units (SI). CTL offers 12 unique calibration services including Antenna Gain and Polarization, Noise Temperature, Quantum-Based Voltage Standards, Repetitive Waveform Generators, and others. Stakeholders rely on CTL for these services because of its unparalleled expertise in delivering measurements with high accuracy and resolution in niche environments where precision is paramount.
Metrology and Calibration Services Roadmap Timeline
Current Activities
This calibration service is offered primarily for determining the absolute on-axis gain and polarization of standard gain horns, which, in turn, are used as reference standards in determining the gain and polarization of other antennas by the gain comparison technique. In the extrapolation method, three antennas are normally utilized, and three pairwise combinations are determined. The received signal transmitted between each pair of antennas is measured as a function of the separation distance between the antennas. The antennas need not be identical, and no assumptions concerning the polarization are required. The method is not well suited for pattern measurements but is the most accurate technique known for absolute gain and polarization measurements. For gain measurements from 2 GHz to 30 GHz, the uncertainties are typically 0.10 dB; above 30 GHz, the uncertainties are typically 0.15 dB. Uncertainties of 0.05 dB/dB for polarization axial ratio measurements are typical. There are antenna size limitations associated with existing NIST extrapolation ranges. These limitations depend on the type of antenna, the frequency, and the desired measurements and accuracies. Therefore, negotiations must be conducted prior to submitting antennas for calibration to ascertain whether all requirements can be met.
This set-up fee is required for the On-Axis Gain and Polarization SKU63100S service. The set-up fee is charge once per order and does not depend on the outcome (if any) of the on-axis gain and polarization measurement(s). This fee covers the labor required to setup the antennas for testing.
This special-test service is for measuring the impulse response of sampling oscilloscopes (samplers) and the output of calibration-grade signal generators such as pulse generators, digital pattern generators, arbitrary waveform generators, comb generators, and vector signal generators. The service is optimized for measuring very fast signals, such as pulse transitions less than 100 ps, i.e., 3 dB attenuation bandwidths greater than 3.5 GHz and whose spectral content is negligible above 110 GHz. The measurements are calibrated and traceable to the NIST electro-optic sampling (EOS) system, NIST microwave power standards, and NIST scattering parameter measurements. The service measures the voltage as a function of time on a 5 ns measurement epoch and is reported with point-by-point time-domain and/or frequency-domain uncertainties. From the time-domain waveform, pulse parameters can be calculated.
Open-end waveguides (200 MHz to 450 MHz) are used to generate standard electromagnetic fields for calibrating antennas and electromagnetic field probes. Pyramidal horns (0.45 GHz to 40 GHz) are used to generate standard electromagnetic fields for calibrating antennas and electromagnetic field probes.
Standard electromagnetic fields are generated in TEM cells and used to calibrate the response of electromagnetic field probes and small antenna systems in the frequency range 10 kHz to 300 MHz.
The NIST voltage measurement service provides a determination of the quantum-based operation of a Josephson Voltage Standard (JVS) Reference Instrument. The traceability path to the SI is realized by the quantum behavior of the Josephson Effect and through the frequency provided to the JVS. As a result of the redefinition of SI units in May 2019, the Josephson standards became the fundamental means by which to realize the volt. The PJVS and JAWS systems are both primary standards – they are based on a fundamental, invariant quantum phenomenon. This service is meant to test Standard Reference Instruments (SRI 6000 and SRI 6011) to verify correct quantum-based operation.
Microwave devices are characterized by their reflection and transmission properties. One-port devices such as matched terminations and offset shorts are characterized by measuring their reflection properties or voltage reflection coefficient. Two-port devices such as attenuators are characterized by measuring both their reflection and transmission properties.
During the roadmapping process, CTL engaged external stakeholders in the industry sector through a working group to provide feedback on Metrology and Calibration Services gaps to ensure a comprehensive and robust approach to defining CTL goals. Stakeholders with a wide range of expertise including calibrations, RF measurements, metrology, traceability, and satellite communications, gathered to identify additional gaps, prioritize gaps according to industry need, and discuss technology trends and innovative opportunities for research.
