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Response to Public Comments: Building a Metrology Exchange to Innovate in Semiconductors (METIS)
Published
Author(s)
Sidney Bittman, June W. Lau, Gretchen Greene
Abstract
In December 2023, NIST released a publication outlining a proposed data-sharing platform, titled "Building a Metrology Exchange to Innovate in Semiconductors (METIS)." The publication was open to public comment from December 2023 to February 2024 to allow for a diversity of people to contribute their viewpoints and to ensure that stakeholders could provide critical feedback to shape the final paper outlining the vision for this data exchange. NIST received numerous comments and identified trends that fell broadly into four specific categories. In this publication, NIST discusses the trends and themes that emerged and provides thematic responses.
RFI, public comment, semiconductors, microelectronics, metrology, data security, database utility and value, data provenance and traceability, database functionality
Bittman, S.
, Lau, J.
and Greene, G.
(2024),
Response to Public Comments: Building a Metrology Exchange to Innovate in Semiconductors (METIS), OTHER, National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.CHIPS.1100-1, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957941
(Accessed October 3, 2025)