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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films:

Published

Author(s)

Frank L McCrackin
Citation
- NBS TN 242
Report Number
NBS TN 242

Citation

McCrackin, F. (1964), A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.TN.242 (Accessed April 30, 2024)
Created January 1, 1964, Updated May 19, 2023