NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Characterizing Pattered Block Copolymer Thin Films with Soft X-rays

Published

Author(s)

Daniel F. Sunday, Jiaxing Ren, Christopher D. Liman, Lance Williamson, Roel Gronheid, Paul Nealey, Regis J. Kline
Citation
ACS Applied Materials and Interfaces
Pub Type
Journals

Download Paper

DOI Link
Self-assembly

Citation

Sunday, D. , Ren, J. , Liman, C. , Williamson, L. , Gronheid, R. , Nealey, P. and Kline, R. (2017), Characterizing Pattered Block Copolymer Thin Films with Soft X-rays, ACS Applied Materials and Interfaces, [online], https://doi.org/10.1021/acsami.7b02791 (Accessed October 8, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 20, 2017, Updated January 27, 2020
Was this page helpful?