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PUBLICATIONS

Estimating t-way Fault Profile Evolution During Testing

Published

Author(s)

David R. Kuhn, Raghu N. Kacker, Lei Yu

Abstract

Empirical studies have shown that most software interaction faults involve one or two variables interacting, with progressively fewer triggered by three or more, and no failure has been reported involving more than six variables interacting. This paper introduces a hypothesis for the origin of this distribution, with implications for removal of interaction faults and reliability growth.
Conference Dates
June 10-14, 2016
Conference Location
Atlanta, GA
Conference Title
IEEE Conference on Computers, Software & Applications
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/COMPSAC.2016.110

Keywords

combinatorial testing, software fault, testing
Information technology

Citation

Kuhn, D. , Kacker, R. and Yu, L. (2016), Estimating t-way Fault Profile Evolution During Testing, IEEE Conference on Computers, Software & Applications, Atlanta, GA, [online], https://doi.org/10.1109/COMPSAC.2016.110 (Accessed October 10, 2025)

Issues

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Created August 25, 2016, Updated November 10, 2018
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