TY  - CONF
AU  - David Kuhn
AU  - Raghu Kacker
AU  - Lei Yu
C2  - IEEE Conference on Computers, Software & Applications, Atlanta, GA
DA  - 2016-08-25
DO  - https://doi.org/10.1109/COMPSAC.2016.110
LA  - en
PB  - IEEE Conference on Computers, Software & Applications, Atlanta, GA
PY  - 2016
TI  - Estimating t-way Fault Profile Evolution During Testing
ER  -