@conference{221461,
  author = {David Kuhn and Raghu Kacker and Lei Yu},
  title = {Estimating t-way Fault Profile Evolution During Testing},
  year = {2016},
  month = {2016-08-25},
  publisher = {IEEE Conference on Computers, Software & Applications, Atlanta, GA},
  doi = {https://doi.org/10.1109/COMPSAC.2016.110},
  language = {en},
}