NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

TOOLS & INSTRUMENTS

Sample Preparation and Metrology Tools

Fischione 1040 Nanomill
Fischione 1040 Nanomill for post-FIB clean up of TEM lamellae.
Leica DM8000
Leica DM8000 optical microscope for inspection. Features polarization optics, including DIC, and long working distance objectives (~1cm) up to 100x.
Gatan Precision Ion Polishing System
Gatan Precision Ion Polishing System for TEM preparation.
 Image of optical detector on coin taken with stackshot camera
 Image of optical detector on coin taken with stackshot camera
Credit: Nathan Tomlin
optical profilometer
Zeta optical profilometer for large scale imaging and thickness profiling.
microscope
Bruker Dimension Icon/Fastscan Atomic Force Microscope for surface characterization

 

Nanofabrication / manufacturing, Nanometrology, Nanophotonics and Physics
Created June 8, 2016, Updated May 4, 2021
Was this page helpful?